IC testing equipment

DELTA tests wafers and components

DELTA has invested heavily in its semiconductor testing resources, and operates one of the largest commercially-available microelectronics testing facility in Europe.

We can provide any or all of the testing required for ICs, from wafer test, through qualification testing, to the final production test of packaged devices.

Among our major capital equipment investments are:

Component testers (ATE)

• Teradyne Catalyst Mixed Signal Testing for advanced ASICs/High Pin Count
• Teradyne Catalyst Mixed Signal Testing for advanced ASICs/High Pin Count
• Teradyne A585 Mixed Signal Testing for advanced ASICs
• Teradyne J750 VLSI Digital Testing for High Pin Count (320 pins)
• Verigy 83000C VLSI Digital Testing
• Verigy 93000 Single Density (608 pins) with Griffen RF option & mixed signal instruments
• Verigy 93000 Double Density with Postscale RF option & mixed signal instruments

Wafer probers

• TSK-90A upgraded to UF200 Hot chuck, 256k dice/wafer
• TSK-90A upgraded to UF200 Off-site ink, 256k dice/wafer
• TSK UF200 AL with Hot chock, 100k dice/wafer
• TSK UF200 AL with Hot chock, 100k dice/wafer
• TSK UF200 SA with Hot chock, 100k dice/wafer
• TSK UF200 SA with Hot chock, 100k dice/wafer
• A-PM-90A, 4, 6, and 8 inch wafer at 25 - 150°C

Component handlers

Different handlers can be used to optimise test throughput, supporting test rates to 1500 devices/hour. Some handlers support dual or quad site testing.

We handle DIL, PLCC, QFP, SO, BGA, TSOP, LCC, MLP, QFN and other package types:

• MultiTest MT9510 - Ambient pick & place handler
• MultiTest MT9510 - Ambient pick & place handler
• MultiTest MT9928 Tri-Temp gravity handler
• MultiTest MT9928 Tri-Temp gravity handler
• MultiTest MT8589H - Hot / Ambient Temp gravity handler
• MultiTest MT8589HC - Tri-Temp gravity handler
• ASECO S200 - Tri-temp pick & place handler
• ASECO S200 - Ambient pick & place handler

Other test equipment

• Loranger Sentry 9H Dynamic burn-in chamber
• Hereaus VMS 03 Temperature cycling chamber
• Hirayama HAST Testing - Pressure Cooker Test

Test development

DELTA provides the complete hardware/software development service for IC test applications. Investments in this area include TSSI's design-to-test vector generation tools - which support all leading ATE formats.

Failure analysis

DELTA also operates its own in-house microelectronics failure analysis department. Our specialised equipment ranges from mechanical access techniques to X-ray and scanning electron microscope examination.