IC testing equipment

DELTA tests wafers and components

DELTA has invested heavily in its semiconductor testing resources, and operates one of the largest commercially-available microelectronics testing facility in Europe.

We can provide any or all of the testing required for ICs, from wafer test, through qualification testing, to the final production test of packaged devices.

Among our major capital equipment investments are:

Component testers (ATE)

• 2 pcs. Teradyne Catalyst Mixed Signal Testing for advanced ASICs/High Pin Count
• Teradyne A585 Mixed Signal Testing for advanced ASICs
• Teradyne J750 VLSI Digital Testing for High Pin Count (320 pins) and RFID-option
• Verigy 83000C VLSI Digital Testing
• Verigy 93000 Single Density (P600, 608 dig. pins) with Griffen RF option & mixed signal instruments
• Verigy 93000 Double Density (PS800, 288 dig. pins) with Postscale RF option & mixed signal instruments
• Verigy 93000 Double Density (PS800, 256 dig. Pins) with Griffen RF option & mixed signal instruments

Wafer probers

• TSK/ACCRETECH UF3000, 8" and 12" wafers
• TSK-90A upgraded to UF200 hot chuck
• TSK-90A upgraded to UF200
• 2 pcs. TSK UF200 AL with hot chuck

• 2 pcs. TSK UF200 SA with hot chuck

Component handlers

We handle DIL, PLCC, QFP, SO, BGA, TSOP, LCC, MLP, QFN and other package types:

• 3 pcs. MultiTest MT9510 - Ambient pick & place handler
• 3 pcs. MultiTest MT9928 Ambient / Hot gravity handler
• MultiTest MT8589H – Ambient / Hot gravity handler
• MultiTest MT8589HC - Tri-Temp gravity handler

Other test equipment

• Dynamic burn-in chamber
• Temperature cycling chamber

Test development

DELTA provides the complete hardware/software development service for IC test applications. Investments in this area include TSSI's design-to-test vector generation tools - which support all leading ATE formats.

Failure analysis

DELTA also operates its own in-house microelectronics failure analysis department. Our specialised equipment ranges from mechanical access techniques to X-ray and scanning electron microscope examination.